You are cordially invited to attend the seminar organized by the Department of Chemistry.
Title: Junctions and Interfaces as Probed by XPS
Speaker: Prof. Sefik Suzer, Bilkent University
Date: October 21, 2025, Tuesday
Time: 12:30 (GMT +3)
Location: SB-Z14 (Department Seminar Room)
Junctions and Interfaces as Probed by XPS
Abstract:
X-Ray Photoelectron Spectroscopy, XPS, is a well-established surface and chemical analysis technique with a probe-length of typically 4-8 nm in commonly used lab-based commercial instruments having an Al-Kα (1486.6 eV) x-ray source. An under-utilized ability of the technique that was essentially developed in BILCHEM, relies on its ability to also Detect, Quantify and Tract Local – Electrical-Potential Developments in a Chemically Specific Fashion with also Limited Time Resolution. This lecture will present the basics of the technique for investigating Chemical and Electrical properties of Solid-Solid Interfaces of p-Si/n-Si, such as p-n Junctions, and Liquid-Solid Interfaces, such as Graphene/Ionic Liquid Devices, carried out in our laboratory over the last 3 decades.
Short Biography of the Speaker: He graduated from METU Chemistry Department in 1970 and went to carry out Ph.D. studies at U. C. Berkeley until March 1976 and continued Postdoctoral work in Sydney University (Australia) and Frieburg University (Germany, as a Humboldt Fellow) before joining METU in Turkey in 1979. He, then joined Bilkent University (Turkey) in 1992. He has been conducting research on surface science and spectroscopy with a focus on charging phenomena in XPS analyses, using both static (DC) and dynamic (AC) voltage stimuli, for material and device characterization involving thin films, solids as well as solid/liquid interfaces. He had served as Editors, and still serving as Editorial Members of several Surface-Science Journals. He is currently members of the ACS, RSC and AVS, and Fellow of the AVS since 2010.